利用Mach-Zehnder干涉仪测量晶体的折射率与光学均匀性

Measuring Refractive Index and Optical Homogeneity of Crytal with MachZehndr Interferometer

本文介绍了利用Ｍａｃｈ－Ｚｅｈｎｄｅｒ干涉仪测量平板状透明介质折射率的方法，给出了测量公式，分析了各种测量误差以及可能达到的测量精度。通过对纯质ＬｉＮｂＯ３晶体片的折射率ｎｅ的测量，证实了该方法的可行性，并表明其特别适合于高折射率的各向异性晶体片折射率的测量。

: A method of measuring refractive index of transparent media plate with MachZehnder interferometer is introduced, its formula is given, measurement errors and precisions are analyzed in this paper. The practicability of the method introduced is proved by measuring extraordinary refractive index of pure LiNbO_3 crystal plate, and it is shown that the method is used for measuring high refractive index of anisotropic crystal plate especially.