摘要
重点介绍由MCS-51单片机控制的温度测试系统的硬件结构,并在此基础上进行了软件设计。系统采用上位机和下位机组成的主从式结构,上位机采用组态软件,配合下位机的开发工作,下位机以MCS-51单片机为代表。
This paper gives emphasis to introduce the temperature test system's hardware architecture, which is controled by the MCS-51 monolithic integrated circuit and the software design is carded out on the basis. This system may use the superior machine and the lower position machine composition host; the superior machine uses the configuration software to coordinate the lower posi- tion machine development work and the lower position machine takes MCS -51 the monolithic integrated circuit as representative.
出处
《机械制造与自动化》
2009年第1期153-153,156,共2页
Machine Building & Automation
关键词
MCS-51单片机
数据采集
温度测试
A/D转换
MCS-51 monolithic integrated circuit
data acquisition
temperature test
A/D transforms