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CMOS全差分超宽带低噪声放大器 被引量:1

A Differential UWB CMOS Low Noise Amplifier
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摘要 文中给出了一个应用于超宽带射频接收机中的全集成低噪声放大器,该低噪声放大器采用了电阻并联负反馈与源极退化电感技术的结合,为全差分结构,在Jazz0.18μm RF CMOS工艺下实现,芯片面积为1.08mm2,射频端ESD抗击穿电压为1.4kV。测试结果表明,在1.8V电源电压下,该LNA的工作频带为3.1~4.7GHz,功耗为14.9mW,噪声系数(NF)为1.91~3.24dB,输入三阶交调量(IIP3)为-8dBm。 A differential ultra-wideband CMOS low noise amplifier that combines inductive source degeneration and resistive shunt-feedback is presented. Prototype fabricated in Jazz 0. 18um RF CMOS process achieves a maximum power gain of 15.5dB, a noise figure of 1.91 dB to 3.24 dB within the 3 dB bandwidth of 3.1-4.7 GHz, an input IP3 of-8 dBm and an HBM ESD hardness of 1.4 kV, while drawing 8.3 mA from a 1.8 V supply.
出处 《固体电子学研究与进展》 CAS CSCD 北大核心 2008年第4期554-558,共5页 Research & Progress of SSE
基金 国家部级十一五项目(No.51308020403 No.51408060905-jW0702)
关键词 互补金属氧化物半导体 超宽带 低噪声放大器 CMOS ultra-wideband (UWB) low noise amplifier (LNA)
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参考文献10

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同被引文献7

  • 1E Ajith Amerasekera,Charvaka Duvvury. ESD inSilicon Integrated Circuits [M ]. 2nd Edition. UK:John Wiley and Sons, 2002 : 85-88.
  • 2Youri Tretiakov, Kunal Vaed, David Ahlgren, et al. On wafer deembedding for SiGe/BiCMOS/RFCMOStransmission line interconnect characterization [C].IEEE Interconnect Technology Conference, 2004:166-168.
  • 3Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum. Com-prehensive ESD protection for RF inputs [J]. Micro-electronics Reliability, 2005,45(2) : 245-254.
  • 4Dong Shurong, Li Mingliang,Guo Wei, et al. Com-plementation SCR for RF IC ESD protection [J]. Elec-tronic Letters, 2010,46(3) : 213-214.
  • 5Yen Chengcheng,Liao Chisheng, Ker Mingdou. Newtransient detection circuit for system-level ESD pro-tection [C]. International Symposium on VLSI De-sign ,Automation and Test, 2008: 180-183.
  • 6徐代果,赵建明,李儒章.数模混合电路的全芯片防静电保护[J].微电子学,2008,38(4):534-539. 被引量:5
  • 7Xin WANG,Siqiang FAN,Hui ZHAO,Lin LIN,Qiang FANG,He TANG,Albert WANG.Whole-Chip ESD Protection Design for RF and AMS ICs[J].Tsinghua Science and Technology,2010,15(3):265-274. 被引量:2

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