硅CMOS红外焦平面64×64元读出电路

Si-CMOS Infrared Focus Plane for 64×64 Readout Circuit

介绍了一种红外焦平面64×64元读出电路的主要工作原理、工艺设计及测试技术。根据电路实际的应用和性能需求调节设计和工艺参数,通过对红外探测器产生的信号进行积分、取样,并在DIC-8032测试系统上利用特殊的测试方法完成电路的测试,从而使电路达到最佳性能指标。

This paper introduces operation principle process design and testing method of readout circuit for infrared focus 64 × 64. according to the electric circuit physically of the application requires accommodate parameter of design and process, the signal of infrared detectors is proceeded to the integral and sampling. In the DIC - 80C32 testing system complete the circuit testing though the special test method, so the circuit can achieve best of all performances.