摘要
利用X射线衍射和扫描电子显微镜对不同衬底温度下电子束蒸发的CaS∶TbF3电致发光薄膜的结晶性和表面形貌进行了研究.通过对薄膜的透射率和漫反射率的测量研究了薄膜的致密性.X射线衍射表明衬底温度在220到580℃范围之间,电子束蒸发的CaS∶TbF3电致发光薄膜为多晶立方晶相.随着衬底温度的提高,CaS∶TbF3薄膜的表面形貌发生显著的变化,薄膜的致密性增加,从而增加了电致发光亮度.
The crystallinity and morphology of crystalline grains were studied on CaS∶TbF 3 electroluminescent thin films prepared by electron beam evaporation under different substrate temperatures from 220 to 580℃. The brightness of the electroluminescence strongly increased with increasing the substrate temperatures. X ray diffraction analysis indicated that the CaS∶TbF 3 films were polycrystalline with cubic phase. The surface morphology of the films, the decrease of the diffuse reflectance and the increase of transmittance indicated that the CaS∶TbF 3 films became denser with increasing the substrate temperatures. These changes reduce scattering to hot electrons and finally caused a strong increase of the electroluminescent brightness by increasing hot electrons energy in CaS∶TbF 3 films.
出处
《发光学报》
EI
CAS
CSCD
北大核心
1998年第1期36-40,共5页
Chinese Journal of Luminescence
基金
中国国家"863"高技术和美国惠普公司合作项目
关键词
硫化钙
电致发光
衬底温度
表面形貌
亮度
薄膜
calcium sulphide, electroluminscence, substrate temperature, surface morphology, crystallinity