摘要
利用电子显微分析技术对高Co含量的室温铁磁性半导体Zn_(1-x)Co_xO_(1-δ)进行了微观表征.证明了氧含量是决定Zn_(1-x)Co_xO_(1-δ)薄膜微观结构和磁性能的重要因素.在缺氧环境下,薄膜由含有大量氧缺位的纤锌矿结构的Zn_(1-x)Co_xO_(1-δ)纳米晶(直径约5 nm)和填充其间的Zn-Co-O非晶相组成,两相对薄膜宏观磁性均有贡献;在富氧的环境下,非晶Zn-Co-O相消失,出现了CoO反铁磁相,纤锌矿结构Zn_(1-x)Co_xO_(1-δ)中的氧缺位大量减少,晶粒长大到10—20 nm,室温铁磁性逐渐减弱,直至消失.
The microstructure of the room temperature ferromagnetic semiconductor Zn1-xCoxO1-δwas investigated by analytical electron microscopy.The experimental results indicated that the oxygen content decided the microstructure and the magnetic property of Zn1-xCoxO1-δThe films deposited under poor oxygen consist of 5 nm sized wurtzite Zn1-xCoxO1-δand amorphous Zn-Co-O between them,of which both are ferromagnetic phases.The films deposited under rich oxygen consist of 10—20 nm Zn1-xCoxO1-δand antiferromagnetic phase CoO,the concentration of the oxygen vacancy in wurtzite is greatly reduced,and the room temperature ferromagnetism is greatly weakened and even disappeared.
出处
《金属学报》
SCIE
EI
CAS
CSCD
北大核心
2008年第11期1399-1403,共5页
Acta Metallurgica Sinica
基金
国家重点基础研究发展计划资助项目2007CB924903~~
关键词
室温铁磁性半导体
氧分压
氧缺位
调控
room temperature ferromagnetic semiconductor
oxygen partial pressure
oxygen vacancy
modulation