摘要
提出了一种基于遗传算法的高层次测试综合方法.该方法在调度、模块分配和寄存器分配过程中考虑电路的可测性问题.给出了一种可以同时进行高层次调度和模块分配的遗传算法染色体编码,并设计了基于数据依赖的单点杂交算子和基于控制步约束的变异算子,避免了进化过程中不可行解的产生.实验结果表明,该方法有效地改善了可测性.
A high-level test synthesis based on genetic algorithm is proposed. This can give consideration to the testability problem in process of scheduling, module allocating and register allocating. Meanwhile, a chromosome coding of genetic algorithm is proposed, which can be used for high-level scheduling and module allocating simultaneously. A one point crossover operator based on data depen- dence and a mutation operator based on control step constrain are designed to avoid the generation of infeasible solutions. The efficiency of testability improvement has been demonstrated by experiment.
出处
《北京邮电大学学报》
EI
CAS
CSCD
北大核心
2009年第1期34-38,共5页
Journal of Beijing University of Posts and Telecommunications
基金
国家自然科学基金项目(60273081)
关键词
高层次综合
可测性
遗传算法
high-level synthesis
testability
genetic algorithm