DDS自动测试技术研究

Study on Automatic Test of DDS

重点研究了如何快速又精确地输出DDS的测试值并使测试值符合测试规范。基于NI卡板、信号分析仪、示波器和信号发生器,对DDS的特性参数进行测试研究。信号发生器提供时钟信号与比较器输入;信号分析仪对频域和调制域信号进行测试;示波器对时域信号进行测试;通过LabVIEW编程得到DAC数字正弦波和输入数字码并实现测试自动化;最后将结果返回计算机,测试结果符合规范。实验证明,在实际应用中该方法快速精确并具有很好的通用性,可拓展到其他芯片的测试。

How to output DDS measurement value fast and accurate and make the measurement meet the specifications were focused on. Experiments were conducted to test the characteristic parameters of DDS using NI digital I/O board, signal analyzer, digital phosphor oscilloscope and arbitrary waveform generator. The arbitrary waveform generator was used to provide clock and input signal of comparator; the test frequency domain signal and modulated domain signal were tested by signal analyzer; digital phosphor oscilloscope was used to test time domain signal; digital sine waves with frequency for the DAC and automatization of test were achieved by LabVIEW programming, at last all of the results will return to the computer, the measurement meets the specifications. The experiments demonstrate that this method can achieve quick and precise result in actual application and have promising universality, and it also can extend to other IC tests.