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边界扫描技术及其应用 被引量:13

Principle and Application of Boundary Scan Test Technology
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摘要 边界扫描技术是一种应用于数字集成电路器件的标准化可测试性设计方法,它提供了对电路板上元件的功能、互连及相互间影响进行测试的一种新方案,极大地方便了系统电路的测试。介绍了支持JTAG标准的IC芯片结构,并以PC机作为平台,利用边界扫描技术对某飞控计算机系统中的CPU电路板进行测试,实现了该电路板的可测性设计,体现了边界扫描技术对于芯片互连故障测试检验效率高,控制简单方便,易于实现的优越性。 Boundary scan technology applied to the digital integrate circuits is an integrated and standardized method to the problem of test. It provides a solution to the test of component functionality, board interconnection and interaction, which facilitates the debugging of system circuit ry. This article introduces the IC chip structure that support s JTAG standard, and test the CPU module of Flight Control System by boundary scan technology on PC platform, and the realization of the measurability design of the circuit board is presented. Of all these manifest the method is highly effective, simply and conveniently controlled, and easily realized.
作者 陈亮 胡善伟
出处 《航空计算技术》 2009年第1期128-130,137,共4页 Aeronautical Computing Technique
关键词 边界扫描 边界扫描测试技术 JTAG boundary scan boundary scan test technology JTAG
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参考文献4

  • 1IEEE Std 1149. 1 -1990,Test Access Port and Boundary Scan Architecture[ S].
  • 2陈光禹 潘中良.可测试性设计技术[M].北京:电子工业出版社,1997..
  • 3杨廷善.边界扫描技术及其应用[J].测控技术,2000,19(9):5-8. 被引量:7
  • 4Texas Instruments. SN54ABT18245A, SN74ABT18245A - Scan Test Devices With 18 -Bit Bus Transceivers [Z]. 1999.

二级参考文献5

  • 11.Pat McHugh.IEEE P1149.5 Standard Module Test and Maintenance Bus.Autotestcon'93
  • 22.Lee Nayes,Larry Lauenger.Adding Boundary Scan Test Cability to an Existing Multi-Strategy Tester,Autotestcon'93
  • 33.Jayal Lakhani.Design of Hierarchical Testable Digital Architecture,Autotestcon'93
  • 44.Ungar L Y.Built-in Test IC Provides Automatic Test Equipment Capabilities,Autotestcon'91
  • 55.Milgram J D.Automated Boundary-Scan Diagnostics:Adding Value to Interconnect Testing,Autotestcon'92

共引文献13

同被引文献56

引证文献13

二级引证文献19

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