ICP-AES法测定矿石及原料中痕量钒钛

DETERMINATION OF TRACE VANADIUM AND TITANIUM IN ORES AND MATERIALS BY ICP-AES

采用ICP－AES光谱法，通过大量基体元素对钒、钛的谱线干扰试验研究，选取了钒310.230nm，钛334.940nm两条谱线作为测定谱线，并通过K系数校正法和基体匹配的办法，消除了基体干扰和光谱干扰。可测定大于0.001％的钒，0.0005％的钛相对标准偏差分别小于5％，3％。

Experimental study was conducted of the interference effects of a number of matrix elements on V and Ti spectrum using ICP - AES spectrographic analysis. V 310.230 nm and Ti 334. 940urn were selected as the two measurement spectrum lines,and K coefficient correction and matrix adaptation methods were applied to eliminate the matrix and spectrum interference. Measurement can be conducted on V>0. 001% and Ti>0.0005% with standard deviation less than 5% and 3% respectively.