散粒噪声时间序列测试方案研究

Research on the Test Scheme for Shot Noise Time Series

散粒噪声携带纳米结构与器件载流子输运丰富的信息,为了提取这些信息,需要完整地测量散粒噪声时间序列。文中从全计数统计(FCS)学对噪声信号分析需求出发,通过分析散粒噪声特点和影响因素,提出了一种实现纳米结构与器件散粒噪声时间序列的测试方案,并论证了方案实现的方法。

Shot noise carries rich information about carrier transport in nano structures and devices. To obtain the information, it is necessary to test shot noise time series. On the basis of the demand of FCS on noise signal analysis, this paper puts forward a test scheme for testing shot noise time series in nano structures and devices by analyzing noise character and influencing factors and verifies the scheme.