摘要
本文论述了管芯温度对器件可靠性的影响、附加静态功耗电流Icc△的概念、Icc△的产生机理以及影响Icc△的内外部因素,提醒电子系统设计者必须对HCT系列电路的Icc△引起重视,确保系统的可靠性。
The influence of die temperature on device reliability, the mechnism of producing Icc△. and the dependence of various factors on Ice. are described in this paper. And propose that, the electronics system designer takes care to emphasize Icc△, to assure reliability ofsystem.
出处
《微电子学与计算机》
CSCD
北大核心
1998年第3期12-14,共3页
Microelectronics & Computer