故障矩阵映射法

THE MAPPING METHOD OF FAULT MATRIXES

本文在[1],[2],[4],[5]的基础上提出了求同步或异步时序电路测试序列的一个代数方法——故障矩阵映射法。应用该算法可以求出检测单故障或多重故障的最短测试序列集(STS)。

An algebric method of finding test sequences for synchronous or asynchronous sequential circuits, called the mapping method of fault matrixes, is put forward on the basis of [1, 2, 4, 5] . By using it the set (STS) of the shortest test sequences can be found.