微处理器功能测试的改进算法

An Improved Algorithm for Functional Testing of Microprocessors

本文首先定义微功能的概念,并由此引出了微处理器中指令时序功能块的故障模型。根据算术逻辑单元的特点,给出了相应的故障模型本文的微处理器测试算法首先核实一个本文定义的变形有限状态机,从而得到微处理器的初始化序列。继而给出了指令时序功能块和数据传输功能块的测试算法,并证明了这两个功能块的测试算法就是微处理器的测试算法,从而简化了微处理器的测试生成。最后将本文指令时序功能块测试算法和文献[2]的方法进行了比较。

In this paper the concept of microfunction is first defined and then a fault model for the instruction sequencing function of microprocessors is introduced. According to the features of ALU, a corresponding fault model is given. In our testing algorithm for microprocessors, a modified finite state machine defined in this paper is first checked, and an initialization sequence for microprocessors is obtained. Then, the testing procedures of the instruction sequencing function and the data transfer function are derived. It is proved that this two testing procedures must be the testing procedures of microprocessors, thus simplifying the test generation of microprocessors. Finally, the test procedures of the instruction sequencing function presented in this paper are compared with the method in [2].