摘要
The new model for parallel repairable system is introduced, and it is based on the practice problems of maintenance and the idea of Ion-Channel modeling. In the new model, repair times that are sufficiently short （less than some critical value） do not result in system failure, and such a repair interval is omitted from the downtime record. Usually, the underlying process is Markov process if the durations of working and repair time have the negative-exponential distributions, but the new system has not the Markov properties, which is worth to study. The reliability indexes such as instantaneous availability and steady-state availabilities for the new system are given through probability analysis. A numerical example is given to illustrate the results.
The new model for parallel repairable system is introduced, and it is based on the practice problems of maintenance and the idea of Ion-Channel modeling. In the new model, repair times that are sufficiently short （less than some critical value） do not result in system failure, and such a repair interval is omitted from the downtime record. Usually, the underlying process is Markov process if the durations of working and repair time have the negative-exponential distributions, but the new system has not the Markov properties, which is worth to study. The reliability indexes such as instantaneous availability and steady-state availabilities for the new system are given through probability analysis. A numerical example is given to illustrate the results.
基金
Sponsored bythe National Natural Science Foundation of China(70671009)
the Postgraduate Science and Innovation Project of Beijing Instituteof Technology (GC200818)
