摘要
针对接触器电寿命试验的特点,利用晶闸管技术和单片机控制的方式设计了一种无触点试验设备,用于替代原有的采用接触器作为陪试品的试验方式。该设备具有成本低、控制精度高、响应时间短、可靠性高等特点,可满足低压电器检测行业的发展需求。
Aiming at the characteristics of electrical endurance test of contactor, a non-contact test equipment was designed based on thyristor technique and single chip control, which can replace the conventional test with accompanying contactor. This equipment features with low cost, high precision, quick response and high reliability and can meet the requirements of low voltage electrical apparatus test industry.
出处
《低压电器》
北大核心
2009年第5期17-19,共3页
Low Voltage Apparatus
关键词
接触器
晶闸管
寿命试验
检测
contactor
thyristor
lifetime test
testing
