摘要
单道工序能力指数Cp和单道工序的成品率y是全面质量管理TQC(TotalQualityControl)的两个关键参数.本文利用余误差函数表和线性插值修正法计算了不同Cp的y值,并给出了对应表格,从而大大方便了数理统计方法在工业化大生产中的实际应用.
Both processing capability index Cp and yield y in one step are key parameters in Total Quality Control(TQC). The function y of Cp is calculated by means of Co-error function table and linear interpolating correction in this paper, and a table of y-Cp is also given. It will he very convenient to apply mathematic-statistical method to industrial mass production.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1998年第5期125-128,共4页
Acta Electronica Sinica
关键词
工序能力指数
成品率
数理统计
IC
制造
Processing capability index, Yield, Mathematic-statistical method