SDRAM辐照效应测试系统的研制

Development of the Measurement System for Radiation Effect on SDRAM

文章利用CPLD及DSP作为系统的核心部件,设计了最大可测256MB、32位的SDRAM辐照效应在线测试系统。系统可以动态监测辐照期间SDRAM的翻转地址、翻转数等参数,基本满足辐照效应的测试要求。

A testing system for radiation effects on SDRAM was developed with a CPLD and DSP as the system core components, which can measure the 256MB, 32bit SDRAM. Some important parameters for radiation effects such as upset address and upset data can be dynamic gained with this system. So it is very useful for studying the radiation effects on SDRAM.