摘要
在长期从事XPS分析测试的经验基础上,搜集了有关文献中的大量数据,编制了XPS光电子峰和俄歇电子峰峰位表,用于正确识别各种样品XPS谱图中的电子峰,达到快速、正确分析各种样品元素组成和化学组成的目的.本峰位表对于从事XPS测试的分析人员和应用XPS的科技人员具有很好的实用价值.
Based on the rich experience in XPS analysis, we have compiled the tables of peak positions for XPS photoelectron and Auger electron peaks. The purpose of the data compilation is to identify various peaks in XPS spectra and then to carry out elemental and chemical state analysis quickly and correctly. The data in the tables are collected from many sources in the literature and they are very useful to the people engaged in XPS analysis and research work.
出处
《分析测试技术与仪器》
CAS
2009年第1期1-17,共17页
Analysis and Testing Technology and Instruments
关键词
X射线光电子能谱
元素组成分析
化学态分析
X- ray photoelectron spectroscopy
elemental composition analysis
chemical state analysis
