摘要
本研究以70名正常青年人为对象,用SCC—I型头部云纹摄影仪拍摄面部正位云纹片、面部侧位30°及45°云纹片,进行面部对称性研究。本研究中确定了NV为面部中线,FH为面部矢状断面对称性分析的参考线;提出了面部中线结构偏差(D)及面部对称结构偏离度(Dd)的概念及计算方法;建立了额状面、水平面及矢状面上面部对称分析的方法,面部水平断面平均偏高度、额状断面平均偏离及矢状断面平均偏离度均小于10％,中线结构偏差小于2mm。
By tanking the frontal, lateral 30°and 45°photographes by Moire cephalometric apparatus (model SCC-Ⅰ), we studied the facial symmeltry in 70 Chinese young people. We established NV as a factal middle line, FH as a reference line for the symmetrical analysis of facial sagittal section, and put forwad the concept and the calculated methods of the deflect (D) of facial middle line structures, and the deflect degree (Dd) of the facial symmetrical structures, and developed the symmetrical analysis methods of facial structures in irontal, horizontal and sagital planes. Average deffect degree of frontal, horizontal and sagittal plancs was below 10%, deflect and middle line structures was below 2 mm.
