摘要
通过Ta掺杂改性钨青铜陶瓷(Sr0.5Ba0.5)1.9Ca0.1NaNb5–xTaxO15(x=0～0.30),分析了Ta掺杂量对其烧结性能、微观结构及介电性能的影响。陶瓷的烧结温度随x的增大略有提高。当x<0.10时,陶瓷的tC和弛豫性变化不大;当x≥0.10时,tm(1kHz)明显降低,从270℃(x=0)降低至231℃(x=0.30)。且tm随频率增加向高温移动,弛豫性明显增强。认为Ta掺杂引起其性能变化是由于Ta—O键与Nb—O键键能的差异,导致陶瓷氧八面体中心离子位移量以及A位离子有序程度的变化所致。
Tungsten bronze ceramics （Sr0.5Ba0.5）1.9Ca0.1NaNb5-xTaxO15 （x=0-0.30） were prepared by traditional solid state method, and the effects of Ta-doped amounts on the sintering properties, microstructures and dielectric properties were analyzed. Sintering temperature of the ceramic increases a little with the increase ofx. Little variations of Curie temperature and relaxor behavior can be observed in the ceramic when x〈0.1. While x≥0.1, the temperature corresponding to the maximum relative dielectric constant （tm, 1 kHz） decreases obviously from 270 ℃ （x = 0） to 231 ℃ （x = 0.30）. And tm shifts to the higher temperature as frequency increases. In addition, the relaxor properties is significantly enhanced. The changes of property for the ceramics doped with Ta are attributed to the difference of bond energy between Ta-O and Nb -O bonds, which results in the variations of displacement of the center ions in oxygen octahedra and the order degree of A-site ions.
出处
《电子元件与材料》
CAS
CSCD
北大核心
2009年第4期1-3,共3页
Electronic Components And Materials
基金
福建省科技重大专项资助项目(No.2005HZ02-3)
福建省高等学校新世纪优秀人才支持计划资助项目(No.XSJRC2007-16)
关键词
无机非金属材料
固相反应法
钨青铜陶瓷
介电弛豫
non-metallic inorganic material
solid state reaction method
tungsten bronze ceramic
dielectric relaxation
