卫星光通信系统中SRAM/MOS器件的单粒子翻转率分析

Single event upset rate analysis of SRAM/MOS equipments in satellite optical communication system

为了分析单粒子事件对卫星光通信系统造成的影响,需要预估器件的单粒子翻转率。通过比较微分能谱方法和FOM方法,选取FOM方法估算了在不同高度和不同倾角下的单粒子翻转率。分析了质子单粒子翻转率与空间轨道的关系。提出了基于单粒子翻转率的器件可靠性指标。数值计算结果表明,在较低轨道高度和较小轨道倾角条件下,SRAM/MOS器件受单粒子翻转影响较小、可靠性较高。

To analyze the single event effects on satellite optical communication system, the single event upset （SEU） rate needs to be estimated. Through compare with differential energy spectrum method and figure of merit method, the latter is chosen to estimate the single event upset rate under different altitude and different inclination. The relation between single proton upset rate with space orbit is analyzed. The reliability index of equipment based on SEU is proposed. The numerical calculation results prove that the effect of SEU to SRAM/MOS equipment under lower orbit altitude and inclination is less, and have higher reliability.