单片机总线上多时钟域下数据传递的可靠性研究

Reliability of data transfer in multiple-clock-domain on single chip microcontroller bus

对单片机总线上多时钟域下数据传递的可靠性进行研究,阐述了使用寄存器锁存电路、多级锁存电路2种方法解决多时钟域下数据传递可靠性时存在的问题,提出了采用4级锁存并判断跳变沿的方式能确保多时钟域下数据可靠传递的方法,具有很高的应用价值.

The reliability of data transfer was studied in multiple-clock-domain on single chip microcontroller bus. The deficiencies of two methods, register clock out circuit and multi-level lock out circuit, which used to promote the data transfer reliability in multiple-clock-domain, were described. The four-level lock out circuit and an edge trigger circuit method was put forward, and the results were shown that it was able to guarantee reliable data transfer and this method was high practical.