摘要
基于ANSYS的概率设计技术对压电双晶片位移型传感器的位移特性和灵敏度特性进行了有限元分析.求得了压电双晶片位移传感器灵敏度与双晶片的材料参数和几何尺寸的关系.分析结果对于压电双晶片传感器的设计和优化具有重要的工程意义.
Displacement sensing properties and sensitivity of a piezoelectric bimorph are investigated based on the probabilistic design technology(PDT) included in ANSYS software. The relationships between the sensitivity and the piezoelectric material constants, geometrical dimensions of the piezoelectric bimorph are carried out in detail. The analyzed results would give some important instructions to the design and optimization of the piezoelectric bimorph sensors for the practical applications.
出处
《湖南理工学院学报(自然科学版)》
CAS
2009年第1期66-69,共4页
Journal of Hunan Institute of Science and Technology(Natural Sciences)
基金
湖南省自然科学基金项目(08JJ4012)
湖南省科技计划项目(06FJ3142)
岳阳市科技计划项目(岳市财企指[2007]3号)
关键词
压电双晶片
传感器
灵敏度
有限元
piezoelectric bimorph
sensor
sensitivity
finite elemen