六氰合铁酸锰铬修饰电极的原位椭圆偏振表征

Characterization of Manganese/Chromium Hexacyanoferrate Modified Electrode with In-Situ Ellipsometry

采用原位椭圆偏振光谱技术表征了六氰合铁酸锰铬膜(MnCrHCF/Pt)修饰电极。并比较了原位掠射椭圆偏振法、原位反射椭圆偏振法和循环伏安法表征此修饰电极的异同,发现此三种方法在表征修饰电极上有相似之处。

Manganese/Chromium Hexacyanoferrate Modified Electrode was characterized by Ellipsometry. We compared the characterized results of Graze Ellipsometry and reflect Ellipsometry and Cyclic Voltammetry, and some similarities could be observed among them.