期刊文献+

网络化边缘扫描集成电路测试系统研制

The Development of BST Integrated Circuits Test System Based on Network
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摘要 简单论述了边缘扫描测试技术,详述了研制的网络化边缘扫描测试系统的构建方法。针对测试系统的实际应用进行了说明。 In this paper, the Boundary - scan test technology is briefly discussd, At the same time the construction method of the Boundary - scan test system based on newwork is disused in detail. And it also discusses the application of the BST test system.
出处 《微处理机》 2009年第1期22-24,27,共4页 Microprocessors
关键词 边缘扫描测试 以太网 集成电路测试系统 Boundary - scan Test (BST) Ethernet IC test system
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参考文献3

  • 1IEEE Std 1149, 1 -2001 :IEEE Standard Test Access Port and Boundary Scan Architecture [ S ]. USA : Published by the Institute of Electrical and Electronics Engineers, Inc, NY 10017,2001:2 - 15.
  • 2P T Wagner. Interconnect Testing with Boundary Scan [J]. Proc. Intl Test Conf. (ITC 87), IEEE CS Press, 1987:52 - 57.
  • 3IEEE Std 1149.4 - 1999 : IEEE Standard for a Mixed Signal Test Bus [ S ]. USA : Published by the Institute of Electrical and Electronics Engineers, Inc, NY 10016 - 5997,1999 : 1 - 9.

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