X射线荧光光谱法测定氢氧化镁中杂质含量

Impurity determination of Mg(OH)_2 with X-ray fluorescence spectrometry

为测定氢氧化镁中杂质元素含量,采用X射线荧光光谱(XRF)法进行重复性和准确性试验.结果表明,XRF法具有快速、无损、多元素同时测定、检测元素范围广等特点,重复性较好.XRF法测量结果与化学方法和电感耦合等离子体发射光谱(ICP)法的测量结果接近,准确性较好.

X-ray fluorescence spectrometry(XRF) was used to do replicate and accuracy tests to determine the amount of impurity content of Mg(OH)_2.Results show that XRF has the characteristic of fast speed,lossless,simultaneous multi-element analysis and wide range of elements detection,and the repeatability is good.The measurement results of XRF are close to that of chemical method and ICP method,which has good accuracy.