一种基于存储器故障原语的March测试算法研究

Improvement of March Algorithm Based on Memory Fault Primitive

研究高效率的系统故障测试算法,建立有效的嵌入式存储器测试方法,对提高芯片良品率、降低芯片生产成本,具有十分重要的意义。从存储器基本故障原语测试出发,在研究MarchLR算法的基础上,提出March LSC新算法。该算法可测试现实的连接性故障,对目前存储器的单一单元故障及耦合故障覆盖率提升到100%。采用March LSC算法,实现了内建自测试电路(MBIST)。仿真实验表明,March LSC算法能很好地测试出嵌入式存储器故障,满足技术要求。研究结果具有重要的应用参考价值。

An effective test algorithm and test method for e-memories is significant to yield improvement and product cost-saving. A new algorithm, March LSC, based on March LR and memory fault primitive,was proposed. March LSC is capable of testing real linked-faults, and the fault coverage of single-cell faults and coupling faults was improved to 100%. MBIST （memory built in self test） circuits were implemented by using March LR and March LSC algorithms, and simulation was made for fault coverage. It has been demonstrated that the new algorithm March LSC could test memory faults effectively.