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微机继电保护装置应力筛选条件探讨

Microcomputer Jidan Baohu Installment Stress Screening Conditiondiscussion
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摘要 提出了用一种可靠性强化试验方法来考核微机保护装置的可靠性,通过该试验找到适合微机保护装置的环境应力筛选条件,同时可以预先发现设计和制造上的缺陷,经过改进可以提高保护装置的可靠性。 A reliability enhancement testing method is used to check the reliability of microcomputer based protection devices,by which microcomputer based protection devices environmental stress screening condition was found.The defect caused by design and manufacture can also be found in advance,and after refinement the reliability of microcomputer based protection devices can be improved.
作者 魏祎迪
出处 《吉林工程技术师范学院学报》 2006年第12期17-18,共2页 Journal of Jilin Engineering Normal University
关键词 微机保护 应力筛选 可靠性 microcomputer based protection stress screening Reliability
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  • 1程依明.步进应力加速寿命试验的最优设计[J].应用概率统计,1994,10(1):52-61. 被引量:32
  • 2王玲玲,王炳兴.对数正态分布下序进应力加速寿命试验的统计分析[J].华东师范大学学报(自然科学版),1995(4):1-8. 被引量:8
  • 3葛广平 马海训.Weibull分布场合下步进应力加速寿命试验的统计分析[J].数理统计与应用概率,1992,7(2):150-159.
  • 4朱美娴.高加速寿命试验(HALT)与高加速应力筛选(HASS)[J].装备质量,2001,3:1-14.
  • 5Hobbs G K. HALT and HASS Seminar [C]. Detroit, MI, February 26, 1996. http://www.hobbsengr.com.
  • 6Robert H, Gusciora. The Use of HALT to Improve Computer Reliability for Point-of-Sale Equipment [C]. 1998 Proceeding Annual Reliability and Maintainability Symposium, 89-93.
  • 7David Rahe. The HASS Development Process [C]. 2000 Proceeding Annual Reliability and Maintainability Symposium, 389-394.
  • 8Silverman M. HASS Development Methods: Screen Development, change schedule, and re-prove schedule [C]. 2000 Proceeding Annual Reliability and Maintainability Symposium, 245-247.
  • 9Silverman M. Summary of HALT and HASS Results at an Accelerated Reliability Test Center [C]. 1998 Proceeding Annual Reliability and Maintainability Symposium, 30-36.
  • 10Robert W D. Reliability Enhancement Testing (RET) [C]. 1994 Proc. Annual Reliability and Maintainability Sym, 91-98.

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