精硒中微量杂质元素的发射光谱法测定

THE DETERMINATION OF TRACE IMPURITIES IN REFINED SE BY EMISSION SPECTRUM

本文介绍了用发射光谱法测定精硒中微量杂质元素铜、砷、锑、铁、镁、铅、铝、锡、硅、硼、碲、镍、铋、银的方法,进行了电流、电极以及曝光和显影时间的选择等条件试验,本方法各元素回收率为86%～116%,相对标准偏差为±6.0%～14.1%.

This article describes the determination of trace impurities in refined Se,such as Cu,As,Sb,Fe, Mg,Pb,Si,B,Te,Ni,Bi,Ag,etc. by way of emission spectrum. Conditional tests have been done with respect to the selections of current,electrode and time of exposure and developing. The recovery of each element ranges at 86%~ 116%, and relative standard error at±6.0%-14.1% by this method.