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Observation of fractal patterns on superconducting Bi_2Sr_2Ca_1Cu_2O_(7-x) films on silicon by AFM

Observation of fractal patterns on superconducting Bi_2Sr_2Ca_1Cu_2O_(7-x) films on silicon by AFM
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摘要 SUPERCONDUCTING Bi<sub>2</sub>Sr<sub>2</sub>Ca<sub>1</sub>CU<sub>2</sub>O<sub>7-x</sub>(BSCCO) films have been prepared in-situ on Si substrates with yttria stabilized zirconia (YSZ) buffer layers by rf magnetron sputtering. The superconducting BSCCO films have a critical temperature (T<sub>c</sub>) of 82 K. Atomic force microscope (AFM) and transmission electron microscope (TEM) were used to image the surface morphology and microstructure of superconducting BSCCO films. Fractal patterns were
出处 《Chinese Science Bulletin》 SCIE EI CAS 1997年第6期526-528,共3页
关键词 FRACTAL BSCCO films. fractal, BSCCO, films.
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