摘要
FOR a long time, people pay particular attention to the way to decrease the charging current and improve the Faraday current in the modern square wave voltammetry (SWV), but the effects of random noise on analytical result are ignored. However, it is impossible to avoid the random noise absolutely in the measuring process. Especially, when the concentration is low, the signal is affected seriously by the random noise and it is difficult to get a lower detection limit. So it is necessary to know how to decrease the random noise in order to get a lower detection limit, while trying to find out how to decrease the charging current. A new sampling technique using the square wave potential scan is proposed to smooth the random noise and decrease the detection limit in SWV. The foundation of this new method comes from one of the laws of mathematical statistics; that is, the positive and negative probable errors in a group of detected data exist equally and then the sum of all the errors is ze-
