摘要
本文论述了双光子激光感应荧光法对原子能级寿命的测量。利用激光窄带有选择地激发Xe原子的2P1和2P3能复，从而测量了它们的能好寿命。观测到的荧光衰变曲线显示很好的单指数衰变曲线，并与指数模拟曲线基本一致。
In this paper, the meacurements of atom energy level lifetime with laser two photon induced fluorescence have been stated. Xe atom's 2P1 and 2P3 energy levels were excited electively by a narrow band pulse laser and measured their energy level lifetimes.The observed fluorescence decaying curves are very good one index decaying curves. and in good agreement with the index simulated curves
出处
《武陵学刊》
1995年第3期45-51,共7页
Journal of Wuling
关键词
双光子
能级寿命
跃迁
Two photon
laser
induced fluorescence
energy level lifetime
transition
