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Design for testability of BiCMOS inverters

Design for testability of BiCMOS inverters
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摘要 BiCMOS circuits have the advantages of both Bipolar and CMOS circuits of high densi-ty, large driving capability and high speed performance. They are widely used inhigh-performanee mixed analog-digital integrated circuits. But with the increase of IC density, especially the complexity of BiCMOS
作者 叶波 郑增钰
出处 《Chinese Science Bulletin》 SCIE EI CAS 1995年第12期1052-1054,共3页
关键词 BICMOS INVERTERS OPEN FAULTS SHORT FAULTS TESTABILITY design. BICMOS INVERTERS OPEN FAULTS SHORT FAULTS TESTABILITY DESIGN
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