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Structural observation of CdSt_2 LB films and nanometer scale lithography by atomic force microscopy

Structural observation of CdSt_2 LB films and nanometer scale lithography by atomic force microscopy
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摘要 Langmuir-Blodgett (LB) films and related thin organic films have been the objects ofincreasing technological and scientific interest over the past 20 years. Optimization of themacroscopic physical properties of these systems requires a detailed understanding of theirstructure-property retations on microscopic scale, including the structure of transferred
作者 杨晓敏 韦钰
出处 《Chinese Science Bulletin》 SCIE EI CAS 1995年第10期845-849,共5页
关键词 ATOMIC force MICROSCOPY LB film NANOMETER scale lithography. atomic force microscopy, LB film, nanometer scale lithography.
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