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THE MEASUREMENT OF COMPLEX PERMITTIVITY OF ANISOTROPIC DIELECTRICS BY MEANS OF AN ELECTROMAGNETIC OPEN RESONATOR

THE MEASUREMENT OF COMPLEX PERMITTIVITY OF ANISOTROPIC DIELECTRICS BY MEANS OF AN ELECTROMAGNETIC OPEN RESONATOR
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摘要 By applying the perturbation method and the complex-source-point theory, the theoretical research of measurement of complex permittivity of uniaxial anisotropic materials by means of an electromagnetic open resonator has been made, and the double refraction phenomenon due to anisotropy of measured dielectric materials has been quantitatively analyzed. Finally, measurements have been made on some single-crystal quartz specimens using an automated open resonator measurement system at 8mm band. By applying the perturbation method and the complex-source-point theory, the theoretical research of measurement of complex permittivity of uniaxial anisotropic materials by means of an electromagnetic open resonator has been made, and the double refraction phenomenon due to anisotropy of measured dielectric materials has been quantitatively analyzed. Finally, measurements have been made on some single-crystal quartz specimens using an automated open resonator measurement system at 8mm band.
作者 夏军 梁昌洪
出处 《Journal of Electronics(China)》 1994年第2期156-163,共8页 电子科学学刊(英文版)
基金 Supported by the Doctoral Fbundation of the State Education Commission of China
关键词 ELECTROMAGNETIC open RESONATOR ANISOTROPIC dielectrics COMPLEX PERMITTIVITY PERTURBATION method Complex-source-point theory Electromagnetic open resonator Anisotropic dielectrics Complex permittivity Perturbation method Complex-source-point theory
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