用准开路短路法同时测量微波频率下的复介电常数和导磁率

Measuring The Complex Pe(?)mittivily And Permeabilily Simultaneously Under Microwave Frequencis With Quasi-Oper-Short End Techniques

本文在终端短路开路法基础上,提出周准开路短路法同时测量微波频率下的复介电常数和导磁率,由计算机完成较为复杂的计算,可同时给出误差的范围。分祈、计算和测量结果表明:ε＇和μ＇的测量误差一般在±1O％以内,tgδe和tgσm的测量误差通过适当选择试样厚度和准开路线长度可以控制在±30％以内,本方法适用于隐身材料和一般非低损耗材料的复介电常数和导磁率的测量。

Based on the short-open-end technique a quasi-open-short-end technique is suggested to measuring the complex permittivity and permeability of substances simultaneously under microwave frequencies. Making sophisticaled calculation, the computer will output not only the desired results but also the corresponding errors.It is shown hy analysing, caltulatiny and pracliical measuring that the errors are usually limited within ±10 percent for ε'and υ',and can be controlled within +30 percen for tgδe and tgδm by chosing specimen thickness and open end line length property. This technique is effec tive for measuring the complex permittivity and permeabilily of concealing material and usual lossysubstances.