摘要
本文提出一种新的散斑纹影照相法用干透明介质的全场密度测试。讨论了光学系统的原理和实验方法。用该技术测量等温平板周围的温度,结果与全息、微型热电偶测量结果一致。
This Paper presents a new method based on speckle schlieren teehnique for the measurement of full—field density variations. The basic principles and components of operation of this optical system are dicussed. This method is used to measure the temperature field around ah isothermal vertical plate in free convection. The resurts measured are agreement with the holography interferometry and microthermocouple measurements.
出处
《南昌大学学报（工科版）》
CAS
1989年第3期44-50,共7页
Journal of Nanchang University(Engineering & Technology)
关键词
散斑照相
纹影法
speckle photographic schlieren method
