膜电容器引线片处热击穿问题的研究

Research on the Failure of the Leading Slice of All film Capacitors by Heat

欲提高膜电容器的储能密度，必须解决引线片处的热击穿问题，故此研究了点接触电阻的概率分布规律，发现它符合Ｘ２（４）概率分布并据此推算出电容器引线片最大允许电流。

In order to improve energy density of all film capacitors, the failure of the leading slice by heat should be solved. So this paper researches the law of statistical distribution of spot contact resistances which accord with X 2(4) distribution. The largest current permitted by the leading slice of capacitors is calculated.