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Efficient 1.3-μm electroluminescence from high concentration boron-diffused silicon p^+-n junctions

Efficient 1.3-μm electroluminescence from high concentration boron-diffused silicon p^+-n junctions
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摘要 Etectroluminescence peaking at 1.3 μm is observed from high concentration boron-diffused silicon p^+-n junctions. This emission is efficient at low temperature with a quantum efficiency 40 times higher than that of the band-to-band emission around 1.1 μm, but disappears at room temperature. The 1.3-μm band possibly originates from the dislocation networks lying near the junction region, which are introduced by high concentration boron diffusion. Etectroluminescence peaking at 1.3 μm is observed from high concentration boron-diffused silicon p^+-n junctions. This emission is efficient at low temperature with a quantum efficiency 40 times higher than that of the band-to-band emission around 1.1 μm, but disappears at room temperature. The 1.3-μm band possibly originates from the dislocation networks lying near the junction region, which are introduced by high concentration boron diffusion.
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第4期274-276,共3页 中国光学快报(英文版)
基金 supported by the National Natural Science Foundation of China (Nos. 10874001, 50732001, 10674012, and 60877022) the National "973" Program of China (No. 2007CB613401).
关键词 BORON ELECTROLUMINESCENCE Light emission Boron Electroluminescence Light emission
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