电子设备故障诊断技术综述

Summarization on Fault Diagnosis Techniques of Electronic Equipments

随着电子技术的发展，电子设备组成的复杂化和智能化不断提高，IC芯片制造工艺的不断提高使得VLSI电路的集成密度增加，亦加大了电子设备故障测试的复杂性和难度。文章结合当前电子设备故障诊断的最新成果与发展动态，综述了故障诊断与检测的三种主流方法：即基于解析模型的方法、基于信号处理的方法和基于知识的方法。总结了目前电子设备故障诊断技术的发展概况和趋势。

With the development of electronic technique, the electronic equipments have become more and more complicated and intelligentized. And the high production level of IC chip increased the integration density of VLSI electronic circuits, thus electronic equipment fault diagnosis becomes more and more complex and difficult. The three main methods and techniques are summarized in this paper according to up to date achievement and development of current electronic equipments, namely： to analyze model, to process signal and to use knowledge. At last, the development trend of fault diagnosis technique of electronic equipments is summarized.