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退火温度对ZnO薄膜性能的影响 被引量:1

Influence of annealing temperature on properties of ZnO films
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摘要 采用射频磁控溅射法在硅衬底上制备出具有(002)择优取向ZnO薄膜.利用X射线衍射分析(XRD)、原子力显微镜(AFM)、双光束紫外可见分光光度计等仪器分析了退火温度对ZnO薄膜的结构、应力状态、表面形貌和光学性能的影响.结果表明,在射频功率为100W时所制备的ZnO薄膜,当退火温度为600℃时,能获得最佳c轴取向和最小半高宽,此时ZnO薄膜具有较低的表面粗糙度和较高的透射率. ZnO thin films are deposited on Si substrate by radio frequency (RF) magnetron sputtering tech- nique. By XRD, AFM, and Grating-Spectrometer, the influence of annealing temperature on structural characteristics, the stress, morphology and optical properties for ZnO films are studied. The results show that the ZnO films with RF power (100W) and annealing temperature(600℃) can obtain its est e-axis orientation and the smallest FWHM, and the film possessed the lower surface roughness and the higher transmission.
出处 《纺织高校基础科学学报》 CAS 2009年第1期102-106,共5页 Basic Sciences Journal of Textile Universities
基金 国家自然科学基金资助项目(50271038) 国家重点基础研究发展规划基金资助项目(2004CB619302) 西安工程大学校管项目(2008XG21) 西安工程大学校管项目(2006XG26) 西安工程大学校管项目(2008XG24)
关键词 ZNO薄膜 X射线衍射分析 原子力显微镜 退火温度 透射率 ZnO thin films XRD AFM annealing temperature transmission
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参考文献13

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二级参考文献30

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共引文献10

同被引文献9

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