摘要
介绍了一种在光滑条件约束下密集等高线的跟踪识别方法,解决了等高线的光滑和保真识别问题。
In this paper,the problem of contour smooth recognition is discussed.The method regarding the trace of intensive contour map based on restraint of smooth is introduced.The effectiveness of the new method is illustrated by experiments.
出处
《武汉测绘科技大学学报》
CSCD
1998年第1期36-39,共4页
Geomatics and Information Science of Wuhan University
基金
国家"八五"科技攻关资助