摘要
简要介绍X射线诱导俄歇电子能谱(XAES)用于化学分析的一般性理论。XAES可与X射线光电子能谱(XPS)一起用于元素化学态分析。但是XAES分析有其优势,(1)俄歇参数与荷电位移无关,结果无需荷电校准就可用于价态分析;(2)在一些涉及过渡元素和重元素物质的价态分析时,XAES峰化学位移大于XPS峰;(3)对于分析一些轻元素(如K、Mg、Al等),XAES峰比某些XPS峰有更高的灵敏度。因而,XAES可弥补XPS分析的某些不足,可方便、有效地表征元素价态。通过实例,介绍XAES在这3个方面的实际应用。
General theories on X-ray induced Auger electron spectroscopic chemical analysis are briefly introduced. Both X-ray induced Auger electron spectroscopy （XAES） and X-ray photoelectron spectroscopy （XPS） could be used to identify chemical states of elements. However, the XAES has its novel advantages, in that （1） the Auger parameters are not dependent on charge shifts, i. e. are often used to identify chemical states without any charge corrections; （2） for some transition elements and heavy elements, the XAES peak shifts may be larger than XPS ones; （3） for some light elements （e g, K, Mg, A1）, the XAES sensitivities may be larger than XPS ones. Therefore, XAES could compensate XPS disadvantages in the chemical analysis. In this paper; some typical examples are documented that XAES with the above three advantages could be applied to the chemical analysis.
出处
《现代仪器》
2009年第1期58-61,共4页
Modern Instruments
