摘要
对有机化合物的X射线衍射谱图和计算谱图之间的关系做观察和分析。得到的一些规律性认识,有助于有机化合物的物相鉴定和谱图质量的判断。
The differences and relations between the experimental X-ray diffraction patterns and the calculated ones for organic compounds were observed and analyzed. The found conclusions are helpful for phase identification and estimating the diffraction pattern qualities of organic compounds.
出处
《现代仪器》
CAS
2009年第2期37-39,共3页
Modern Instruments
关键词
X射线衍射
粉末衍射
品质因子
X-ray diffraction Powder diffraction Merit factor