期刊文献+

浅析应用光栅方程满足的实验误差条件 被引量:1

INITIAL ANALYSIS ON THE EXPERIMENTAL ERROR CONDITIONS OF APPLYING THE GRATING EQUATION
下载PDF
导出
摘要 应用光栅方程测量光栅常数或光波波长,若入射光偏离垂直光栅平面方向将导致测量结果出现误差,本文分析了在入射平面内倾斜入射的角度与实验误差的关系。 When the grating equation is used to calculate the grating constant or the wavelength in the grating diffraction experiment, the deviation will be induced if the.incident light is not vertical to the grating plane. In this paper, the relationship between the deviation and incident angle was anayzed.
出处 《大学物理实验》 2009年第1期82-84,共3页 Physical Experiment of College
关键词 光栅方程 实验误差 光波波长 测量 grating equation experimental error
  • 相关文献

同被引文献8

  • 1Li Y,Zhang S,Guo L et al.Collagen coated tantalumsubstrate for cell proliferation[J].Colloids and Sur-faces B:Biointerfaces,2012.
  • 2Allen M J,Hud N V,Balooch M et al.Tip-radius-induced artifacts in AFM images of protamine-com-plexed DNA fibers[J].Ultramicroscopy,1992,42:1095.
  • 3Coen M C,Lehmann R,Groning P et al.Adsorptionand bioactivity of protein A on silicon surfaces stud-ied by AFM and XPS[J].Journal of Colloid and In-terface Science,2001,233:180-189.
  • 4Wade L A,Shapiro IR,Ma Z et al.Correlating AFMprobe morphology to image resolution for single-wall carbon nanotube tips[J].Nano Letters,2004,4:725-731.
  • 5Fang S,Haplepete S,Chen W et al.Analyzing atom-ic force microscopy images using spectral methods[J].Journal of applied physics,1997,82:5891-5898.
  • 6Hug H,Jung T,Guntherodt HJ.A high stabilityand low drift atomic force microscope[J].Review ofscientific instruments,1992,63:3900-3904.
  • 7Ricci D,Braga PC.Recognizing and avoiding arti-facts in AFM imaging[J].In:Atomic Force Micros-copy.Springer,2004:25-37.
  • 8吴世春,彭华.超声光栅的原理与制作[J].大学物理实验,2012,25(2):10-12. 被引量:2

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部