面向系统芯片测试的微处理器结构设计

Microprocessor design for system-on-a-chip testing

采用内嵌微处理器作为测试控制器来测试系统芯片可以提高测试精度和速度,降低测试成本。提出在微处理器结构上做改进,设计了测试数据接口和测试数据解压单元,可以对SOC测试起支持作用。实验结果表明所增加的硬件在电路面积上可接受,对电路性能没有影响,而且对微处理器的正常功能没有任何影响。

To improve the quality of system-on-a-chip testing,embedded microprocessor can be used as testing controller.In order to support this testing methodology,the architecture of microprocessor embedded in system-on-a-chip is designed,including the design of test data transfer interface and test data decompress unit.The experiment show that it can do the test correctly on the cost of acceptable area overhead and none performance overhead.