一种细光路偏光调制实现干涉条纹扫描的新方法

A New Method for Interferogram Scanning with Polarized Light Modulation in Narrow Beam

提出了一种新的干涉条纹扫描方法：在细光路中用小尺寸偏光元件调制进行干涉条纹扫描．此方法克服了以往用大面积偏光器件而在参考光路中引入扰动导致仪器稳定性能变差的缺陷．在本文，从理论上进行了推导、计算和误差分析，给出了干涉仪原理结构和实验室装置．实验结果表明：理论计算与实验结果相符合，证明了所提出的方法可行．

A new method for interferogram scanning with polarized light modulation in narrow beam has been presented in this paper. The method is able to overcome the weak of stability on equipment due to waveform error from reference channel where used a large area polariscope until recently ago. Mathematical counting and error analysis are described. A system of the interferometer and a device for laboratory are given. It is shown that the experiment results are correspond to the theoretical calculation. The method that has been discussed in the study can be applied.