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硅基SiN_xO_y∶C^+薄膜的光致发光 被引量:2

Photoluminescence From Silicon Based SiN x O y ∶C + Films
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摘要 采用等离子体增强化学气相淀积法在单晶硅片表面淀积一层厚约120nm的SiNxOy薄膜,并在薄膜中注入C+,注入能量为35keV,剂量为5×1016cm-2.注C+样品在441.6nm的蓝光激发下,可以产生峰值约为550nm的光致发光.样品经600℃退火后,发光强度达到最大. Abstract A layer of  ̄120 nm SiN x O y film was grown on crystalline silicon wafers by plasma enhanced chemical vapor deposition. Carbon ions were implanted into the film with the energy of 35 keV and the dose of 5×10 16 cm -2 . The C + implanted sample exhibits photoluminescence peaked at 550 nm under the excitation of 441.6 nm laser line, and the luminescence intensity reaches its maximum for sample thermally annealed at about 600 ℃ for 30 min.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 1998年第3期172-176,共5页 半导体学报(英文版)
基金 中国博士后基金 李政道物理学综合实验室正大基金
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同被引文献35

  • 1李群,诸葛兰剑,吴雪梅,项苏留.α-SiO_x∶C薄膜的结构与发光特性研究[J].真空科学与技术学报,2004,24(2):92-94. 被引量:1
  • 2李群,梁坚,黎定国,邓玲娜,吴雪梅,诸葛兰剑.非晶SiO_x:C薄膜的发光特性研究[J].功能材料与器件学报,2006,12(3):192-196. 被引量:2
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