摘要
研究溅射制备的NiTi薄膜的马氏体相变行为．电阻随温度的变化曲线以及变温X射线衍射实验表明，当温度由400℃连续下降到-180℃时，NiTi薄膜发生了B2→R→B19'以及B2→B19'相变．
The martensite transitions of NiTi thin films by magnetron sputtering were studied. The temperature dependence of electrical resistance and the X-ray diffraction patterns indicated the transitions from B2 austenite to R phase, then to martensite and from B2 austenite to martensite in NiTi thin films when temperature decreased from 400℃to-180℃.
出处
《吉林大学自然科学学报》
CSCD
1998年第1期37-39,共3页
Acta Scientiarum Naturalium Universitatis Jilinensis
基金
国家自然科学基金
